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Del B best\u00e5r av f\u00f8lgende tilbeh\u00f8r: \u2022 Anbefalt Sputter Coating System (kan kj\u00f8pes fra en annen leverand\u00f8r) \u2022 Anbefalt Critical Point Dryer System (kan kj\u00f8pes fra en annen leverand\u00f8r)","location_id":[],"estimatedValue":null,"type":"ANNOUNCEMENT_OF_COMPETITION","allTypes":["ANNOUNCEMENT_OF_COMPETITION","COMPETITION"],"status":"EXPIRED","issueDate":"2018-03-09T10:00:00Z","deadline":"2018-04-17T11:00:00Z","sentToTed":true,"publicationDate":"2018-03-09","placeOfPerformance":[],"procurementStrategicLabels":[]},{"id":"2017-714314","buyer":[{"id":"d83ebee1984ee99bdffe8ece9ca58d3e","organization_id":"971 035 854","name":"Universitetet i Oslo"}],"heading":"Tabletop Scanning Electron Microscope","description":"UiO har som m\u00e5l \u00e5 anskaffe et tabletop scanning electron microscope. Mikroskopet vil hovedsakelig bli brukt til morformetriske unders\u00f8kelser av fossiler og nyere funn. Kj\u00f8peren ansl\u00e5r kj\u00f8pets verdi til \u00e5 v\u00e6re ca. 600 000 eksl. mva., men dette er kun et grovt anslag. Det er opp til tilbyderne \u00e5 avgj\u00f8re verdien basert p\u00e5 kravene og spesifikajonen. 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All these detectors shall be included. The SEM instrument shall be able to accommodate additional super-high resolution WDS and uXRF detectors to be purchased later. 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Tilbudet skal inkludere frakt, installasjon, oppl\u00e6ring, forbruksvarer, programvarer for styring av instrumentene, andre n\u00f8dvendige komponenter, m.m.Instrumentet skal anvendes for identifisering og karakterisering av mineraler og andre geologiske materialer vha. SE, BSE, EDS og hyperspektral katodeluminescens CL, samt bildeanalyse i nanometerskala. SEM instrumentet konfigureres slik at ved en senere tidspunkt kan utvides med andre detektorer, som f.eks. ultra-h\u00f8yoppl\u00f8selig WDS og \u00b5XRF. SEM instrumentet skal ha et pr\u00f8vekammer egnet for tynnslip i standard petrografisk st\u00f8rrelse (~28\u00d748mm) samt for runde klosser (\u00f830\u00d715mm), men ikke begrenset til disse. Pr\u00f8vekammer skal v\u00e6re med \u00abair lock\u00bb system. 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Verdien er et estimat og er ikke bindende for oppdragsgiver. Det forutsettes at det foreligger budsjettsmessig dekning. 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Forlengelse av serviceavtale utover materiellets antatte levetid (10 \u00e5r), inng\u00e5r som en del av avtalen.","location_id":["NO020"],"estimatedValue":null,"type":"ANNOUNCEMENT_OF_COMPETITION","allTypes":["ANNOUNCEMENT_OF_COMPETITION","COMPETITION"],"status":"EXPIRED","issueDate":"2026-09-04T08:02:56Z","deadline":"2026-10-09T10:00:00Z","sentToTed":true,"publicationDate":"2026-09-07","placeOfPerformance":["Innlandet"],"procurementStrategicLabels":[]},{"id":"2026-111761","buyer":[{"id":"bed87b482aba566c9511f70f17cf6dc3","organization_id":"916075855","name":"FORSVARSMATERIELL"}],"heading":"Anskaffelse av Scanning Electron Microscope til Forsvarets laboratorietjenester (FOLAT)","description":"Anskaffelsen best\u00e5r av ett kj\u00f8p av vare\u00a0og\u00a0\u00e5rlig serviceavtale.Forsvarets laboratorietjeneste (FOLAT) har til hensikt \u00e5 anskaffe nytt mikroskop av typen Scanning Electron Microscope om benyttes i forbindelse med underst\u00f8ttelse av blant annet\u00a0\u00abchip-warning\u00bb og skade/havari-analyser p\u00e5\u00a0Forsvarets materiellsystemer\u00a0innenfor et vidt spekter av\u00a0oppdrag.I tillegg er det behov for \u00e5rlig serviceavtale\u00a0p\u00e5 materiellet, inkludert\u00a0bytting av deler.\u00a0Forlengelse av serviceavtale utover materiellets antatte levetid\u00a0(10 \u00e5r),\u00a0inng\u00e5r som en del av\u00a0avtalen.","location_id":["NO084"],"estimatedValue":null,"type":"ANNOUNCEMENT_OF_COMPETITION","allTypes":["ANNOUNCEMENT_OF_COMPETITION","COMPETITION"],"status":"EXPIRED","issueDate":"2026-07-02T11:55:00Z","deadline":"2026-08-28T10:00:00Z","sentToTed":true,"publicationDate":"2026-07-03","placeOfPerformance":["Akershus"],"procurementStrategicLabels":[]},{"id":"2020-328578","buyer":[{"id":"91128bca2818631bf6f73d8f5c754c5f","organization_id":"974 760 827","name":"Kripos"}],"heading":"Elektronmikroskop (Scanning Electron Microscope with elemental analyser - SEM/EDS)","description":"Kripos (National Criminal Investigation Service) \u00f8nsker \u00e5 anskaffe et elektronmikroskop (Scanning Electron Microscope with elemental analyser - SEM/EDS) til bruk ved det nasjonale kriminaltekniske laboratoriet i Nor3.962.000ge.","location_id":[],"estimatedValue":null,"type":"ANNOUNCEMENT_OF_CONCLUSION_OF_CONTRACT","allTypes":["ANNOUNCEMENT_OF_CONCLUSION_OF_CONTRACT","RESULT"],"status":null,"issueDate":"2020-10-29T10:00:00Z","deadline":null,"sentToTed":true,"publicationDate":"2020-10-29","placeOfPerformance":[],"procurementStrategicLabels":[]},{"id":"2020-395770","buyer":[{"id":"91128bca2818631bf6f73d8f5c754c5f","organization_id":"974 760 827","name":"Kripos"}],"heading":"Elektronmikroskop (Scanning Electron Microscope with elemental analyser - SEM/EDS)","description":"Kripos (National Criminal Investigation Service) \u00f8nsker \u00e5 anskaffe et elektronmikroskop (Scanning Electron Microscope with elemental analyser - SEM/EDS) til bruk ved det nasjonale kriminaltekniske laboratoriet i Norge.","location_id":[],"estimatedValue":{"currencyCode":"NOK","amount":3750000.0},"type":"ANNOUNCEMENT_OF_COMPETITION","allTypes":["ANNOUNCEMENT_OF_COMPETITION","COMPETITION"],"status":"EXPIRED","issueDate":"2020-03-11T10:00:00Z","deadline":"2020-04-30T13:00:00Z","sentToTed":true,"publicationDate":"2020-03-11","placeOfPerformance":[],"procurementStrategicLabels":[]},{"id":"2023-621711","buyer":[{"id":"d83ebee1984ee99bdffe8ece9ca58d3e","organization_id":"971 035 854","name":"Universitetet i Oslo"}],"heading":"Feltemisjon (FE) skanningelektronmikroskop","description":"Naturhistorisk museum, Universitetet i Oslo, skal kj\u00f8pe et Field Emission Scanning Electron Microscope (FE-SEM) for geovitenskap. 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The SEM instrument shall be able to load via air lock default standard-sized ~28\u00d748mm petrographic thin sections and/or polished blocks \u00f830\u00d710mm (plastiline-mounted on a standard petrographic carrier glass).\u00a0","source":"doffin","attributes":{"status":null},"relationships":[{"type":"buyer","target":{"type":"organization","id":"970188290","namespace":"no:orgnr","canonical_id":"no:orgnr:970188290","name":"Norges geologiske unders\u00f8kelse (NGU)"}}],"_links":{"wiki":"https://allemannsdata.com/wiki/anskaffelse/2021-335849/","api":"https://allemannsdata.com/wiki/api/v1/anskaffelser/2021-335849"}},{"type":"organization","id":"970188290","namespace":"no:orgnr","canonical_id":"no:orgnr:970188290","name":"Norges geologiske unders\u00f8kelse (NGU)","description":"Buyer linked from the procurement notice.","source":"doffin","_links":{"wiki":"https://allemannsdata.com/wiki/selskap/970188290/","api":"https://allemannsdata.com/wiki/api/v1/selskaper/970188290"}},{"type":"procurement","id":"2020-307820","namespace":"doffin:notice","canonical_id":"doffin:notice:2020-307820","name":"Anskaffelse av \u00e9n Scanning Electron Microscope (SEM)","description":"NGU s\u00f8ker gjennom en konkurranse med forhandling en leverand\u00f8r for ett (1) Scanning Electron Microscope (SEM) instrument med flere detektorer, som beskrevet i Appendiks 1&2. Tilbudet skal inkludere frakt, installasjon, oppl\u00e6ring, forbruksvarer, programvarer for styring av instrumentene, andre n\u00f8dvendige komponenter, m.m.Instrumentet skal anvendes for identifisering og karakterisering av mineraler og andre geologiske materialer vha. SE, BSE, EDS og hyperspektral katodeluminescens CL, samt bildeanalyse i nanometerskala. SEM instrumentet konfigureres slik at ved en senere tidspunkt kan utvides med andre detektorer, som f.eks. ultra-h\u00f8yoppl\u00f8selig WDS og \u00b5XRF. SEM instrumentet skal ha et pr\u00f8vekammer egnet for tynnslip i standard petrografisk st\u00f8rrelse (~28\u00d748mm) samt for runde klosser (\u00f830\u00d715mm), men ikke begrenset til disse. Pr\u00f8vekammer skal v\u00e6re med \u00abair lock\u00bb system. 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Anskaffelsens verdi ansl\u00e5s til over E\u00d8S-terskelverdi. Verdien er et estimat og er ikke bindende for oppdragsgiver. Det forutsettes at det foreligger budsjettsmessig dekning. For n\u00e6rmere informasjon viser vi til anskaffelsesdokumentene.","source":"doffin","attributes":{"status":null},"relationships":[{"type":"buyer","target":{"type":"organization","id":"974 767 880","namespace":"no:orgnr","canonical_id":"no:orgnr:974 767 880","name":"NTNU"}}],"_links":{"wiki":"https://allemannsdata.com/wiki/anskaffelse/2023-323647/","api":"https://allemannsdata.com/wiki/api/v1/anskaffelser/2023-323647"}},{"type":"organization","id":"974 767 880","namespace":"no:orgnr","canonical_id":"no:orgnr:974 767 880","name":"NTNU","description":"Buyer linked from the procurement notice.","source":"doffin","_links":{"wiki":"https://allemannsdata.com/wiki/selskap/974%20767%20880/","api":"https://allemannsdata.com/wiki/api/v1/selskaper/974%20767%20880"}},{"type":"procurement","id":"2023-623670","namespace":"doffin:notice","canonical_id":"doffin:notice:2023-623670","name":"(23077) LVFESEM (Low Vacuum Field Emission Scanning Electron Microscope)","description":"Konkurransen gjelder levering av LVFESEM (Low Vacuum Field Emission Scanning Electron Microscope). Anskaffelsens verdi ansl\u00e5s til over E\u00d8S-terskelverdi. Verdien er et estimat og er ikke bindende for oppdragsgiver. Det forutsettes at det foreligger budsjettsmessig dekning. For n\u00e6rmere informasjon viser vi til anskaffelsesdokumentene.","source":"doffin","attributes":{"status":"EXPIRED"},"relationships":[{"type":"buyer","target":{"type":"organization","id":"974 767 880","namespace":"no:orgnr","canonical_id":"no:orgnr:974 767 880","name":"NTNU"}}],"_links":{"wiki":"https://allemannsdata.com/wiki/anskaffelse/2023-623670/","api":"https://allemannsdata.com/wiki/api/v1/anskaffelser/2023-623670"}},{"type":"procurement","id":"2026-114024","namespace":"doffin:notice","canonical_id":"doffin:notice:2026-114024","name":"Anskaffelse av Scanning Electron Microscope til Forsvarets laboratorietjenester (FOLAT)","description":"Anskaffelsen best\u00e5r av ett kj\u00f8p av vare og \u00e5rlig serviceavtale.Forsvarets laboratorietjeneste (FOLAT) har til hensikt \u00e5 anskaffe nytt mikroskop av typen Scanning Electron Microscope om benyttes i forbindelse med underst\u00f8ttelse av blant annet \u00abchip-warning\u00bb og skade/havari-analyser p\u00e5 Forsvarets materiellsystemer innenfor et vidt spekter av oppdrag.I tillegg er det behov for \u00e5rlig serviceavtale p\u00e5 materiellet, inkludert bytting av deler. 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